AFM | ||||
AFM - LINTES - AKIYAMA PROBE
1 |
With the Optical Microscope MM11 we explore the maximum possible surface of the sample (25.000µ x 25.000µ) and we identify a surface in the volume (5µ x 5µ x 5µ), to be examined with the AFM. |
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With the Optical Microscope MM11 and the PCa Probe-Carrier we position the probe in the bottom left corner of the surface (5µ x 5µ) which was identified in the exploration phase, and we approach the probe to a distance of 2µ above this surface. |
4 |
NANOAPPROACH: | With the nanopositioning tool we approach the A-probe from 2000nm until the point where there is interaction between the A-probe and the sample. |
5 |
RAW MAPPING AND CALIBRATION: | Tuning of the optical vision with the AFM-mapping |
6 |
FINE MAPPING: | Mapping of the identified XYZ surface |
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