Fine Mapping |
FINE MAPPING
Now that we have a raw mapping of the maximum examinable surface in AFM (5.000nm x 5.000nm) |
N° | Code | Brand | Description |
31 |
PCa |
Lintes |
|
32 | G5100A | Picotest | Function Generator |
33 | TDS 220 | Tektronix | Oscilloscope |
N° | Code | Brand | Description |
41 | P-363.3UD | Physik Instrumente | Nanopositioning |
42 | Lintes | cavo ethernet nanopositioning -->computer | |
43 | Apple | computer microscopio | |
44 | LTMatrix | Lintes | SW LTMatrix |